SIGMA SCAN I
High Resolution Transmission Scanning Densitometer
APPLICATIONS
- Production and Quality Control of Transparent Thin Films
- Optical Density of Metallized Polymer Films
- Easy Calibration for Film Resistivity and Thickness
|
 |
STANDARD FEATURES
- Resolution Better than 0.05 mm
- X-Y Plots of Optical Density Scans
- X-Y Location of Features on the Film Surface
- Color Contour Maps for Defect Analysis
- Use Cursor to Measure Distance Between Features on the Film
- Built-in Conversion of Optical Density to Resistivity and Thickness
- Simple Calibration Procedure for Accurate Conversion of Optical Density
to Resistivity for Different Metal Films (Al, Cu, Al/Zn, Ag/Zn, etc..)
- Automated Multiple Line Scans to Produce Optical Density Mappings
Cross the Width of Wide Webs
- Button Selected Commands
- File Storage of Data for Statistical Analysis
Web Scan
High Resolution Web Scanner for Inline Monitoring of Optical
Density, Electrical Conductivity and Color.
Inline Optical Density
Scanner
|
|
STANDARD FEATURES
- Measurement of Optical Densities from 0.00 to 4.00
- Selectable sensor sensitivity
- Self calibrating
- Serial interface; reducing the number of wires required, allowing
for variable hosts, and providing for increased noise immunity
- Real time display of Optical Density and real time calculation
and display of metalized film resistance (ohms/sq.) and thickness,
based on corresponding
- Optical Density data
- Optical Density, Resistance, and Thickness data saved at regular
intervals
- Sensing outputs and equivalent measurements are frequency based,
providing for increased noise immunity and digital versatility
Internal control circuitry can be remotely located from the actual
sensor array (up to 10 feet), allowing for mounting flexibility
and space savings
- Flexible. Software upgrades allow for customization with minimal
effort
- Flexibility in sensing array dimensions and number of elements
employed
|
OPTIONAL FEATURES
- Serially programmable in circuit configuration allowing for
variable user defined applications and for in circuit uploading
of selected lookup tables and/or user directives
- Selectable user defined Optical Density window and sensor alarm
when outside of defined range
- Selectable measurement techniques to tailor sensor speed
- Individual sensor selection and corresponding individual run
history graphs
- Interface to existing web counter/web system to correlate Optical
Density with actual position data
- Increased data transmission rates
|
|
|
